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IEC61032 Test Probe B
IEC61032 Test Probe B
IEC61032 Test Probe B
IEC61032 Test Probe B
IEC61032 Test Probe B
IEC61032 Test Probe B

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Shenzhen Chuangxin Instruments Co., Ltd

Shenzhen,Guangdong,China
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This jointed Test Probe is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

IEC61032 Test Probe B

 key words: Test Probe B, Test Probe, Probe, IEC61032 Probe

 This jointed Test Probe is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

 Conforms to:

 This is the "international" test finger B required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.

 Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.

Technical Parameters:

Kunrled finger diameter 12mm                                   
Knurled Finger length 80mm
Baffle plate diameter 50mm
Baffle plate length 100mm
Baffle thickness 20mm

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